• RecordNumber
    17975
  • Author

    Abramovici, Miron

  • Title

    Digital systems testing and testable design

  • Author Statement
    Miron Abramovici, Melvin A. Breuer [and] Arthur D. Friedman
  • Edition
    Rev. printing
  • Publication
    New York, NY The Institute of Electrical and Electronic Engineers
  • Publication Year
    1990
  • Collation
    xxi, 653 p. : illus
  • Notes
    0780310624 , Includes bibliographical references
  • Subject

    Digital integrated circuits , Digital integrated circuits

  • ADDED ENTRIES
    Friedman, Arthur D. , Breuer, Melvin A. ,
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .A23
  • LC Date
    1990
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=17975&Field=0&DTC=2