• RecordNumber
    23564
  • Author

    Bain, Lee J.

  • Title

    Statistical analysis of reliability and life-testing models : theory and methods

  • Author Statement
    Lee J. Bain
  • Publication
    M. Dekker
  • Publication Year
    1978
  • Collation
    xii, 450 p. ; 24 cm
  • Series
    Statistics: textbooks and monographs ; v. 24
  • Notes
    Includes index , Bibliography: p. 429-438
  • Subject

    Mathematical statistics , Distribution (Probability theory) , Accelerated life testing , Reliability (Engineering)

  • ADDED ENTRIES
    ,
  • LC Class
    TS
  • LC Number
    173
  • LC CutterNumber
    .B34
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=23564&Field=0&DTC=2