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RecordNumber
23627
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Author
Bardell, Paul H.
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Title
Built-in test for VLSI : pseudorandom techniques
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Author Statement
Paul H. Bardell, William H. McAnney, Jacob Savir
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Publication
Wiley
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Publication Year
1987
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Collation
xiii, 354 p. : ill. ; 24 cm
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Notes
Includes index , Bibliography: p. 339-345 , A Wiley-Interscience publication
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Subject
Integrated circuits - Very large scale integration
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ADDED ENTRIES
Savir, Jacob. , McAnney, William H. ,
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LC Class
TK
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LC Number
7874
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LC CutterNumber
.B374
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LC Date
1987
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Link To Document :
