• RecordNumber
    23969
  • Title

    Reliability and degradation : semiconductor devices and circuits

  • Author Statement
    edited by M.J. Howes, D.V. Morgan
  • Publication
    J. Wiley , J. Wiley
  • Publication Year
    1981
  • Collation
    xii, 444 p. : ill. ; 24 cm
  • Series
    The Wiley series in solid state devices and circuits
  • Notes
    Includes bibliographical references and index
  • Subject

    Semiconductors

  • ADDED ENTRIES
    Morgan, D. V. , Howes, M. J.
  • LC Class
    TK
  • LC Number
    7871.85
  • LC CutterNumber
    .R4
  • LC Date
    1981