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RecordNumber
23969
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Title
Reliability and degradation : semiconductor devices and circuits
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Author Statement
edited by M.J. Howes, D.V. Morgan
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Publication
J. Wiley , J. Wiley
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Publication Year
1981
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Collation
xii, 444 p. : ill. ; 24 cm
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Series
The Wiley series in solid state devices and circuits
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Notes
Includes bibliographical references and index
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Subject
Semiconductors
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ADDED ENTRIES
Morgan, D. V. , Howes, M. J.
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LC Class
TK
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LC Number
7871.85
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LC CutterNumber
.R4
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LC Date
1981
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Link To Document :
