RecordNumber
23969
Title
Reliability and degradation : semiconductor devices and circuits
Author Statement
edited by M.J. Howes, D.V. Morgan
Publication
J. Wiley , J. Wiley
Publication Year
1981
Collation
xii, 444 p. : ill. ; 24 cm
Series
The Wiley series in solid state devices and circuits
Notes
Includes bibliographical references and index
Subject
Semiconductors
ADDED ENTRIES
Morgan, D. V. , Howes, M. J.
LC Class
TK
LC Number
7871.85
LC CutterNumber
.R4
LC Date
1981