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RecordNumber
24166
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Author
Leblebici, Yusuf.
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Title
Hot-carrier reliability of MOS VLSI circuits
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Author Statement
by Yusuf Leblebici [and] Sung-Mo (Steve) Kang
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Publication
Kluwer Academic
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Publication Year
1993
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Collation
xvi, 212 p. : ill. ; 25 cm
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Series
The Kluwer international series in engineering and computer science, SECS 227
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Notes
07923952X , Includes bibliographical references and index
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Subject
Hot carriers , Metal oxide semiconductors , Integrated circuits - Very large scale integration
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ADDED ENTRIES
Kang, Sung-Mo , ,
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LC Class
TK
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LC Number
7874
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LC CutterNumber
.L334
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LC Date
1993
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Link To Document :
