RecordNumber
34553
Title
Records of the IEEE International Workshop on Memory Technology, Design and Testing, August 8-9, 1994, San Jose, California
Author Statement
edited by R. Rajsuman; sponsored by the IEEE Computer Society Technical Committee on Test Technology
Publication
IEEE Computer Society Press
Publication Year
1994
Collation
ix, 141P., illus
Notes
081866245X
Subject
Randon access memory , Semiconductor storage devices
LC Class
TK
LC Number
7895
LC CutterNumber
.M4I33
LC Date
1994