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RecordNumber
35538
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Title
System-on-chip test architectures : nanometer design for testability
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Author Statement
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
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Publication
Morgan Kaufmann Publishers
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Publication Year
2008
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Collation
xxxvi, 856 p. : ill.
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Series
The Morgan Kaufmann series in systems on silicon
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Notes
Includes bibliographical references
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Subject
Systems on a chip -- Testing , Integrated circuits -- Very large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Design
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ADDED ENTRIES
Wang, Laung-Terng , Touba, Nur A.
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LC Class
TK
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LC Number
7895
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LC CutterNumber
.E42S97
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LC Date
2008
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وارد کنندة اطلاعات
ZADEHMOHAMMADI
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Link To Document :
