• RecordNumber
    41650
  • Author

    Hurst, S. L

  • Title

    VLSI testing : digital and mixed analogue/digital techniques

  • Author Statement
    S L Hurst
  • Publication
    London Institution of Electrical Engineers
  • Publication Year
    1998
  • Collation
    xx, 532 p. : ill
  • Series
    IEE circuits and systems series 9
  • Subject

    Entegre devreler -- Çok büyük boyutta integrasyon -- Test etme. , Integrated circuits -- Very large scale integration -- Testing , Circuits intégrés à très grande échelle

  • ADDED ENTRIES
    TI
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .H87
  • LC Date
    1998
  • وارد کنندة اطلاعات
    Mehrabi
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=41650&Field=0&DTC=2