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RecordNumber
41650
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Author
Hurst, S. L
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Title
VLSI testing : digital and mixed analogue/digital techniques
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Author Statement
S L Hurst
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Publication
London Institution of Electrical Engineers
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Publication Year
1998
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Collation
xx, 532 p. : ill
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Series
IEE circuits and systems series 9
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Subject
Entegre devreler -- Çok büyük boyutta integrasyon -- Test etme. , Integrated circuits -- Very large scale integration -- Testing , Circuits intégrés à très grande échelle
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ADDED ENTRIES
TI
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LC Class
TK
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LC Number
7874
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LC CutterNumber
.H87
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LC Date
1998
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وارد کنندة اطلاعات
Mehrabi
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Link To Document :
