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RecordNumber
42906
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Author
IEEE International Symposium on Circuits and Systems (2000 : Yamanashi, Japan)
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Title
Proceedings, 2000 IEEE International Symposium onDefect and Fault Tolerance in VLSI Systems : October 25-27, 2000, Yamanashi, Japan
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Author Statement
IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee
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Publication
Los Alamitos, Calif IEEE Computer Society Press
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Publication Year
2000
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Collation
xii, 422 p. : ill.
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Notes
Includes bibliographical references , 0769507190
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Subject
Integrated circuits -- Very large scale integration -- Design and construction -- Congresses , Fault-tolerant computing -- Congresses
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ADDED ENTRIES
IEEE Circuits and Systems Society
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LC Class
TK
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LC Number
7801
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LC CutterNumber
.I593
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LC Date
2000
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Link To Document :
