RecordNumber
57040
Author
Noia, Chakrabarty
Title
Design-for-test and test optimization techniques for TSV-based 3d stacked ICS
Author Statement
Brandon Noia; Krishnendu Chakrabarty; Vishwani D Agrawal
Publication
Cham Springer
Publication Year
2014
Collation
1 online resource (xviii, 247 pages) : illus (some color)
Notes
9783319023779
Subject
Three-dimensional integrated circuits -- Testing , Three-dimensional integrated circuits -- Design and construction , Engineering , Circuits and Systems
ADDED ENTRIES
AU Chakrabarty, Krishnendu , AU Agrawal, Vishwani D , TI
LC Class
TK
LC Number
7874.893
LC CutterNumber
.N6
LC Date
2014
نام فايل
B704D16