• RecordNumber
    5812
  • Title

    Fatigue crack growth under spectrum loads; a symposium presented at the seventy for Testing and Materials, Montreal, Canada, 23-24 June 1975

  • Author Statement
    R. P. Wei and R. I. Stephens
  • Publication
    American Society for Testing and Materials
  • Publication Year
    1976
  • Collation
    339P., illus., diags., tables
  • Series
    American Society for Testing and Materials. Special technical publication; 595
  • Notes
    Includes bibliographical references
  • Subject

    Fnacture mechanics

  • ADDED ENTRIES
    Stephens, R. I. , Wei, R. P. , ,
  • LC Class
    TA
  • LC Number
    409
  • LC CutterNumber
    .S94
  • LC Date
    1975