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RecordNumber
6993
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Title
Oxide reliability: a summary of silicon oxide wearout breakdown, and reliability
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Author Statement
editor, D. J. Dumin
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Publication
World Scientific
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Publication Year
2002
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Collation
ix, 270 p., illus
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Series
Selected topics in electronics and systems; v. 23
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Notes
9810248423 , Includes bibliographical references
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Subject
Silicon oxide , Metal oxide semiconductors
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ADDED ENTRIES
Dumin, D. J. ,
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LC Class
TK
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LC Number
7871.99
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LC CutterNumber
.M44O95
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LC Date
2002
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وارد کنندة اطلاعات
داوري
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Link To Document :
