چكيده به لاتين
With the advent of technology in the field of digital circuits and the sharp decline in the scale of digital circuits, Although the high speed of the circuit was created, the issue of reliability has become an important and challenging topic in this area. By decrease the size of the transistors, their sensitivity to transient faults has increased sharply, and the slightest stimulation can affect the operation of the circuit. One of the most important issues is the reliability of digital circuits is soft error. Soft error occurs when a high-energy particle hits a chip surface. Due to the impact of a high-energy particle to the chip's surface, a transient event occurs at the point of impact, which causes a change in the amount of current value on that part of the circuit. This event can propagate and reach the circuit output and change its value. The estimation of the soft error rate for the design of digital circuits has become an important issue in the reliability of circuits. Aging effect and process variation are influencing factor on soft error rate that should be considered.
This thesis presents a method for estimating soft error rates in digital circuits. In this method, the aging effect and process variation that have an effect in soft error rate are considered as a statistical model. It is possible to analyze the infinite number of transient events on the circuit in the proposed method. In this dissertation, there is a comparison between the soft error rate when the delay of gates is constant and when the delays are affected by the aging effect and process variation, br considering the single-event transient and multiple event transient. In this method, the ISCAS85 circuits have been used. In order to conduct an analysis, we wrote an event driven to propagate an unlimited number of transient events. The results show a significant difference between these two approaches in the estimation of soft error rates, with a minimum difference of 2% and a maximum difference of nearly one. According to the results, applying the effects that mentioned above in the estimation of soft error rate is necessary.
Keywords: Soft Error Rate, Aging Effect, Process Variation, Single Event Transient, Multiple Event Transient
