چكيده به لاتين
The atomic force microscopes (AFM) are known as instruments for imaging or manipulating materials on an atomic scale. Images obtained by this tool, in some cases, require improvement in quality. Some measures at AFM were somewhat achievable for this improvement through mechanical methods (changing the piezoelectric parameters of the device, increasing the scan lines per unit time in the same dimensions, stabilizing the material in motion, reducing the humidity of the environment, changing the scan area, etc.) But in some cases this is not possible. In this research, computer methods and software algorithms are studied to improve the quality of these images. The focus of the project is on strip noise removal techniques in AFM. In this research, we first studied noise recognition using AFM images. Then, using MATLAB software programming, we designed and tested a de-noise algorithm. In the end, comparison of this algorithm with one of the noise elimination methods proposed in ISI articles is discussed.
