• RecordNumber
    12675
  • Author

    Yamabashi

  • Title

    Proceedings IEEE international symposium on defect and fault tolerance in VLSI systems

  • Publication
    IEEE
  • Publication Year
    2000
  • Collation
    440
  • ISBN
    0769507190
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=12675&Field=0&DTC=11