Proceedings of the 1997 6th international symposium on the physical & failure analysis of integrated circuits

RecordNumber
13867
Title
Proceedings of the 1997 6th international symposium on the physical & failure analysis of integrated circuits
Editor
M.K.radhakrishnan and philip ho
Publication
IEEE press
Publication Year
1997
Collation
348
ISBN
0780339851
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=13867&Field=0&DTC=11