• RecordNumber
    2014
  • Author

    Yusuf Leblebici

  • Title

    Hot – carrier reliability of Mos VLSI circuits

  • Publication
    Kluwer Academic Publishers
  • Publication Year
    1993
  • Collation
    222
  • ISBN
    079239352X
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=2014&Field=0&DTC=11