RecordNumber
2014
Author
Yusuf Leblebici
Title
Hot – carrier reliability of Mos VLSI circuits
Publication
Kluwer Academic Publishers
Publication Year
1993
Collation
222
ISBN
079239352X
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=2014&Field=0&DTC=11
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