• RecordNumber
    215
  • Author

    Yamanashi

  • Title

    Defect and fault tolerance in VLSI systems (Proceedings IEEE international symposium)

  • Publication
    IEEE
  • Publication Year
    2000
  • Collation
    421
  • ISBN
    0769507190
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=215&Field=0&DTC=11