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RecordNumber
17975
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Author
Abramovici, Miron
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Title
Digital systems testing and testable design
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Author Statement
Miron Abramovici, Melvin A. Breuer [and] Arthur D. Friedman
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Edition
Rev. printing
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Publication
New York, NY The Institute of Electrical and Electronic Engineers
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Publication Year
1990
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Collation
xxi, 653 p. : illus
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Notes
0780310624 , Includes bibliographical references
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Subject
Digital integrated circuits , Digital integrated circuits
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ADDED ENTRIES
Friedman, Arthur D. , Breuer, Melvin A. ,
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LC Class
TK
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LC Number
7874
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LC CutterNumber
.A23
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LC Date
1990
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Link To Document :
