• RecordNumber
    18057
  • Author

    Tsui, Frank F.

  • Title

    LSI/VLSI testability design

  • Author Statement
    Frank F. Tsui
  • Publication
    McGraw-Hill
  • Publication Year
    1987
  • Collation
    xv, 702 p. : ill. ; 24 cm
  • Notes
    Includes index , Bibliography: p. 591-684
  • Subject

    Integrated circuits - Very large scale integration , Integrated circuits - Large scale integration

  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .T78
  • LC Date
    1987
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=18057&Field=0&DTC=2