• RecordNumber
    19164
  • Author

    Asian Test Symposium (3rd: 1994: Nara, Japan) , Asian Test Symposium (3rd: 1994: Nara, Japan)

  • Title

    Proceedings of the Third Asian Test Symposium: November 15-17, Nara, Japan

  • Author Statement
    sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical
  • Publication
    IEEE Computer Society Press , IEEE Computer Society Press
  • Publication Year
    1994
  • Collation
    xiv, 392 p., illus
  • Notes
    0818666900 , Includes bibliographical references
  • Subject

    Fault-tolerant computing , Electronic circuits , Electronic digital computers - Circuits

  • ADDED ENTRIES
    IEEE Computer Society. Test Technology Technical Committee ,
  • LC Class
    TK
  • LC Number
    7888.4
  • LC CutterNumber
    .A85
  • LC Date
    1994
  • وارد کنندة اطلاعات
    كريمي
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=19164&Field=0&DTC=2