Proceedings of the Third Asian Test Symposium: November 15-17, Nara, Japan

RecordNumber
19164
Author
Asian Test Symposium (3rd: 1994: Nara, Japan) , Asian Test Symposium (3rd: 1994: Nara, Japan)
Title
Proceedings of the Third Asian Test Symposium: November 15-17, Nara, Japan
Author Statement
sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical
Publication
IEEE Computer Society Press , IEEE Computer Society Press
Publication Year
1994
Collation
xiv, 392 p., illus
Notes
0818666900 , Includes bibliographical references
Subject
Fault-tolerant computing , Electronic circuits , Electronic digital computers - Circuits
ADDED ENTRIES
IEEE Computer Society. Test Technology Technical Committee ,
LC Class
TK
LC Number
7888.4
LC CutterNumber
.A85
LC Date
1994
وارد کنندة اطلاعات
كريمي
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=19164&Field=0&DTC=2

Asian Test Symposium (3rd: 1994: Nara, Japan) , Asian Test Symposium (3rd: 1994: Nara, Japan)