• RecordNumber
    23627
  • Author

    Bardell, Paul H.

  • Title

    Built-in test for VLSI : pseudorandom techniques

  • Author Statement
    Paul H. Bardell, William H. McAnney, Jacob Savir
  • Publication
    Wiley
  • Publication Year
    1987
  • Collation
    xiii, 354 p. : ill. ; 24 cm
  • Notes
    Includes index , Bibliography: p. 339-345 , A Wiley-Interscience publication
  • Subject

    Integrated circuits - Very large scale integration

  • ADDED ENTRIES
    Savir, Jacob. , McAnney, William H. ,
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .B374
  • LC Date
    1987
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=23627&Field=0&DTC=2