RecordNumber
24166
Author
Leblebici, Yusuf.
Title
Hot-carrier reliability of MOS VLSI circuits
Author Statement
by Yusuf Leblebici [and] Sung-Mo (Steve) Kang
Publication
Kluwer Academic
Publication Year
1993
Collation
xvi, 212 p. : ill. ; 25 cm
Series
The Kluwer international series in engineering and computer science, SECS 227
Notes
07923952X , Includes bibliographical references and index
Subject
Hot carriers , Metal oxide semiconductors , Integrated circuits - Very large scale integration
ADDED ENTRIES
Kang, Sung-Mo , ,
LC Class
TK
LC Number
7874
LC CutterNumber
.L334
LC Date
1993