• RecordNumber
    26957
  • Title

    Developments in integrated circuit testing

  • Author Statement
    D.M. Miller, editor
  • Publication
    Academic Press
  • Publication Year
    1987
  • Collation
    x, 440 p. : ill. ; 24 cm
  • Series
    Perspectives in computing, vol. 18
  • Notes
    0124967353 , Includes bibliographical references (p. (407)-431)
  • Subject

    Integrated circuits

  • ADDED ENTRIES
    Miller, D. M. ,
  • LC Class
    TK
  • LC Number
    7874
  • LC CutterNumber
    .D48
  • LC Date
    1987