• RecordNumber
    27485
  • Author

    Grin, G.

  • Title

    Semiconductor devices measurements and tests

  • Author Statement
    G. Grin; translated from the Russ. by Alexander Repyev
  • Publication
    Mir
  • Publication Year
    1980
  • Collation
    (208)P., illus., diags., tables
  • Notes
    Bibliography:P. (208) , Rev. from the 1978 Russ. 3rd. ed.
  • Subject

    Semiconductors

  • LC Class
    TK
  • LC Number
    7871.85
  • LC CutterNumber
    .G7
  • LC Date
    1980
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=27485&Field=0&DTC=2