RecordNumber
34611
Title
Proceedings and the Third Asian Test Symposium November 15-17, 1994, Nara, Japan
Author Statement
sponsored by IEEE Computer Society Test Technology Technical Committee; In cooperation with Technica
Publication
IEEE Computer Society Press
Publication Year
1994
Collation
xiii, 393P., illus
Notes
0818666900
Subject
Electronic digital computer - Circuits , Fault - tolerant computing , Electronic circuits - Testing
ADDED ENTRIES
,
LC Class
TK
LC Number
7870
LC CutterNumber
.A82
LC Date
1994
وارد کنندة اطلاعات
محمدزاده