RecordNumber
35538
Title
System-on-chip test architectures : nanometer design for testability
Author Statement
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Publication
Morgan Kaufmann Publishers
Publication Year
2008
Collation
xxxvi, 856 p. : ill.
Series
The Morgan Kaufmann series in systems on silicon
Notes
Includes bibliographical references
Subject
Systems on a chip -- Testing , Integrated circuits -- Very large scale integration -- Testing , Integrated circuits -- Very large scale integration -- Design
ADDED ENTRIES
Wang, Laung-Terng , Touba, Nur A.
LC Class
TK
LC Number
7895
LC CutterNumber
.E42S97
LC Date
2008
وارد کنندة اطلاعات
ZADEHMOHAMMADI