IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C.

RecordNumber
41351
Author
IEEE International Workshop on IDDQ Testing(3rd 1997 Washington, D.C.)
Title
IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C.
Author Statement
edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.IDDQ testing
Publication
IEEE Computer Society Press
Publication Year
1997
Collation
ix, 119 p. ill
Notes
"IEEE Computer Society order number PR08123"--T.p. verso. , "IEEE order plan catalog number 97TB100169"--T.p. verso. , Includes bibliographic references and index , 0818681233
Subject
Iddq testing , Metal oxide semiconductors, Complementary
ADDED ENTRIES
Jayasumana, Anura P , ,
LC Class
TK
LC Number
7871.99
LC CutterNumber
.M44I34
LC Date
1997
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=41351&Field=0&DTC=2

IEEE International Workshop on IDDQ Testing(3rd 1997 Washington, D.C.)