• RecordNumber
    41351
  • Author

    IEEE International Workshop on IDDQ Testing(3rd 1997 Washington, D.C.)

  • Title

    IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C.

  • Author Statement
    edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.IDDQ testing
  • Publication
    IEEE Computer Society Press
  • Publication Year
    1997
  • Collation
    ix, 119 p. ill
  • Notes
    "IEEE Computer Society order number PR08123"--T.p. verso. , "IEEE order plan catalog number 97TB100169"--T.p. verso. , Includes bibliographic references and index , 0818681233
  • Subject

    Iddq testing , Metal oxide semiconductors, Complementary

  • ADDED ENTRIES
    Jayasumana, Anura P , ,
  • LC Class
    TK
  • LC Number
    7871.99
  • LC CutterNumber
    .M44I34
  • LC Date
    1997
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=41351&Field=0&DTC=2