RecordNumber
42157
Author
International Symposium on the Physical & Failure Analysis of Integrated Circuits (6th : 1997 : Singapore)
Title
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits
SubTitle
[IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore]
Author Statement
edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.]. 6th International Symposium on the Physical & Failure Analysis of Integrated Circuites , 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits , IPFA '97
Publication
Institute of Electrical and Electronics Engineers
Publication Year
1997
Collation
[xi], 301, [5] p. : ill
Notes
"IPFA '97 proceedings"--Cover. , "IEEE catalog no. 97TH8289"--Cover. , Includes bibliographic references and author index
Subject
Integrated circuits , Integrated circuits
ADDED ENTRIES
AU Radhakrishnan, M. K. , AU Ho, Philip , AU Chim, Wai Kin , AU IEEE Singapore Section Reliability/CPMT/EDA Chapter , TI
LC Class
TK
LC Number
7874
LC CutterNumber
.I59248
LC Date
1997
وارد کنندة اطلاعات
Mehrabi