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RecordNumber
42214
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Author
IEEE semiconductor thermal measurement and management symposium
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Title
proceedings 1997, thirteenth IEEE semiconductor thermal measurement and management symposium
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Publication
New York, NY Institute of Electrical and Electronics Engineers
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Publication Year
1997
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Collation
xvi,291P.
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Subject
Semiconductors Thermal properties --Congresses , Semiconductors Cooling -- Congresses. , Amorphous semiconductors Thermal properties --Congresses , Integrated circuits Congresses.
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ADDED ENTRIES
TI , TI Thirteenth annual ieee semiconductor thermal measurement and management symposium
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LC Class
TK
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LC Number
7871.85
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LC CutterNumber
.I27
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LC Date
1997
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Link To Document :
