• RecordNumber
    42214
  • Author

    IEEE semiconductor thermal measurement and management symposium

  • Title

    proceedings 1997, thirteenth IEEE semiconductor thermal measurement and management symposium

  • Publication
    New York, NY Institute of Electrical and Electronics Engineers
  • Publication Year
    1997
  • Collation
    xvi,291P.
  • Subject

    Semiconductors Thermal properties --Congresses , Semiconductors Cooling -- Congresses. , Amorphous semiconductors Thermal properties --Congresses , Integrated circuits Congresses.

  • ADDED ENTRIES
    TI , TI Thirteenth annual ieee semiconductor thermal measurement and management symposium
  • LC Class
    TK
  • LC Number
    7871.85
  • LC CutterNumber
    .I27
  • LC Date
    1997
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=42214&Field=0&DTC=2