• RecordNumber
    42906
  • Author

    IEEE International Symposium on Circuits and Systems (2000 : Yamanashi, Japan)

  • Title

    Proceedings, 2000 IEEE International Symposium onDefect and Fault Tolerance in VLSI Systems : October 25-27, 2000, Yamanashi, Japan

  • Author Statement
    IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee
  • Publication
    Los Alamitos, Calif IEEE Computer Society Press
  • Publication Year
    2000
  • Collation
    xii, 422 p. : ill.
  • Notes
    Includes bibliographical references , 0769507190
  • Subject

    Integrated circuits -- Very large scale integration -- Design and construction -- Congresses , Fault-tolerant computing -- Congresses

  • ADDED ENTRIES
    IEEE Circuits and Systems Society
  • LC Class
    TK
  • LC Number
    7801
  • LC CutterNumber
    .I593
  • LC Date
    2000
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=42906&Field=0&DTC=2