• RecordNumber
    42934
  • Author

    Lala, Parag K

  • Birth-Death
    1948-
  • Title

    Digital circuit testing and testability

  • Author Statement
    Parag K. Lala.
  • Publication
    San Diego Academic Press
  • Publication Year
    1997
  • Collation
    xii, 199 p. : illus
  • Notes
    Includes bibliographical references and index , 0124343309
  • Subject

    Integrated circuits , Digital integrated circuits , Integrated circuits

  • ADDED ENTRIES
    TI
  • LC Class
    TK
  • LC Number
    7874.75
  • LC CutterNumber
    .L35
  • LC Date
    1997
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=42934&Field=0&DTC=2