• RecordNumber
    43189
  • Author

    Yamanashi

  • Title

    Defect and fault tolerance in VLSI systems (Proceedings IEEE international symposium)

  • Publication
    IEEE
  • Publication Year
    2000
  • Collation
    421
  • نام فايل
    IUST eb-102 -- eb102d7
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=43189&Field=0&DTC=2