• RecordNumber
    43667
  • Author

    Joes – pineda de Gyvez

  • Title

    Integrated circuit defect- sensitivity: theory and computational models

  • Publication
    Kluwer Academic Publishers
  • Publication Year
    1993
  • Collation
    180
  • نام فايل
    IUST eb-117 -- eb117d13
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=43667&Field=0&DTC=2