Integrated circuit defect- sensitivity: theory and computational models

RecordNumber
43667
Author
Joes – pineda de Gyvez
Title
Integrated circuit defect- sensitivity: theory and computational models
Publication
Kluwer Academic Publishers
Publication Year
1993
Collation
180
نام فايل
IUST eb-117 -- eb117d13
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=43667&Field=0&DTC=2

Joes – pineda de Gyvez