Hot – carrier reliability of Mos VLSI circuits

RecordNumber
44792
Author
Yusuf Leblebici
Title
Hot – carrier reliability of Mos VLSI circuits
Publication
Kluwer Academic Publishers
Publication Year
1993
Collation
222
نام فايل
IUST eb-152 -- eb152d24
Link To Document :
http://dl.iust.ac.ir/dL/search/default.aspx?Term=44792&Field=0&DTC=2

Yusuf Leblebici