• RecordNumber
    44792
  • Author

    Yusuf Leblebici

  • Title

    Hot – carrier reliability of Mos VLSI circuits

  • Publication
    Kluwer Academic Publishers
  • Publication Year
    1993
  • Collation
    222
  • نام فايل
    IUST eb-152 -- eb152d24
    • Link To Document
    https://dl.iust.ac.ir/dl/search/default.aspx?Term=44792&Field=0&DTC=2