RecordNumber
4816
Author
,
Title
Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, J
Author Statement
edited by J.P. Fillard
Publication
Elsevier , Elsevier
Publication Year
1985
Collation
xii, 306 p. : ill. ; 25 cm
Series
Materials science monographs, 31
Notes
Includes bibliographies and index
Subject
Image processing , Gallium arsenide semiconductors , Semiconductors
ADDED ENTRIES
Fillard, J. P.
LC Class
TK
LC Number
7871.85
LC CutterNumber
.I5825
LC Date
1985