Oxide reliability: a summary of silicon oxide wearout breakdown, and reliability

Author Statement

editor, D. J. Dumin

Publication

World Scientific

Publication Year

2002

Collation

ix, 270 p., illus

Series

Selected topics in electronics and systems; v. 23

Notes

9810248423 , Includes bibliographical references

Subject

Silicon oxide , Metal oxide semiconductors

ADDED ENTRIES

Dumin, D. J. ,

LC Class

LC Number

7871.99

LC CutterNumber

.M44O95

LC Date

2002

وارد کنندة اطلاعات

داوري

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